An analytical model for nanowire junctionless SOI FinFETs with considering three-dimensional coupling effect

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摘要 Inthispaper,thethree-dimensional(3D)couplingeffectisdiscussedfornanowirejunctionlesssilicon-on-insulator(SOI)FinFETs.Withfinwidthdecreasingfrom100nmto7nm,theelectricfieldinducedbythelateralgatesincreasesandthereforetheinfluenceofbackgateonthethresholdvoltageweakens.Foranarrowandtallfin,thelateralgatesmainlycontrolthechannelandthereforetheeffectofbackgatedecreases.Asimpletwo-dimensional(2D)potentialmodelisproposedforthesubthresholdregionofjunctionlessSOIFinFET.TCADsimulationsvalidateourmodel.Itcanbeusedtoextractthethresholdvoltageanddopingconcentration.Inaddition,thetuningofbackgateonthethresholdvoltagecanbepredicted.
机构地区 不详
出处 《中国物理B:英文版》 2016年4期
出版日期 2016年04月14日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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