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Determination of Average wall Thickness of Mesoporous silica

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摘要 SmallX-rayScattering(SAXS)experimentusingSynchrotronRadiationasX-raysourcewasusedtodeterminetheaveragewallthicknessofmesoporoussilicaprepardbycondensationoftetraethylorthosilicate(TEOS)usingnon-ionicalkylpolyethyleneoxide(AEO9)surfactantastemplates.Theresultsagreedwiththatofhigh-resolutionTEM(HRTEM)measurement.

DOI ojnk2xr1jr/2051613

作者 ZhiHongLi;YanJunGONG;DongWu;YuHanSUN;JunWANG;YiLIU;BaoZhongDON

机构地区不详

出处《北京同步辐射装置：英文版》 2001年2期

关键词小角X射线散射分析 SAXS 中孔硅石平均壁厚结构分析

分类 [理学][物理]

出版日期 2001年02月12日（中国期刊网平台首次上网日期，不代表论文的发表时间）

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来源期刊

北京同步辐射装置：英文版

北京同步辐射装置：英文版

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小角X射线散射分析 SAXS 中孔硅石平均壁厚结构分析

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