简介:SmallX-rayScattering(SAXS)experimentusingSynchrotronRadiationasX-raysourcewasusedtodeterminetheaveragewallthicknessofmesoporoussilicaprepardbycondensationoftetraethylorthosilicate(TEOS)usingnon-ionicalkylpolyethyleneoxide(AEO9)surfactantastemplates.Theresultsagreedwiththatofhigh-resolutionTEM(HRTEM)measurement.